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2022-03-08
Zhang, Jing.  2021.  Application of multi-fault diagnosis based on discrete event system in industrial sensor network. 2021 4th International Conference on Advanced Electronic Materials, Computers and Software Engineering (AEMCSE). :1122–1126.
This paper presents a method to improve the diagnosability of power network under multiple faults. In this paper, the steps of fault diagnosis are as follows: first, constructing finite automata model of the diagnostic system; then, a fault diagnoser model is established through coupling operation and trajectory reasoning mechanism; finally, the diagnosis results are obtained through this model. In this paper, the judgment basis of diagnosability is defined. Then, based on the existing diagnosis results, the information available can be increased by adding sensor devices, to achieve the purpose of diagnosability in the case of multiple faults of the system.
2021-09-30
Bagbaba, Ahmet Cagri, Jenihhin, Maksim, Ubar, Raimund, Sauer, Christian.  2020.  Representing Gate-Level SET Faults by Multiple SEU Faults at RTL. 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS). :1–6.
The advanced complex electronic systems increasingly demand safer and more secure hardware parts. Correspondingly, fault injection became a major verification milestone for both safety- and security-critical applications. However, fault injection campaigns for gate-level designs suffer from huge execution times. Therefore, designers need to apply early design evaluation techniques to reduce the execution time of fault injection campaigns. In this work, we propose a method to represent gate-level Single-Event Transient (SET) faults by multiple Single-Event Upset (SEU) faults at the Register-Transfer Level. Introduced approach is to identify true and false logic paths for each SET in the flip-flops' fan-in logic cones to obtain more accurate sets of flip-flops for multiple SEUs injections at RTL. Experimental results demonstrate the feasibility of the proposed method to successfully reduce the fault space and also its advantage with respect to state of the art. It was shown that the approach is able to reduce the fault space, and therefore the fault-injection effort, by up to tens to hundreds of times.
2020-05-18
Han, Ying, Li, Kun, Ge, Fawei.  2019.  Multiple Fault Diagnosis for Sucker Rod Pumping Systems Based on Matter Element Analysis with F-statistics. 2019 IEEE 8th Data Driven Control and Learning Systems Conference (DDCLS). :66–70.
Dynamometer cards can reflect different down-hole working conditions of sucker rod pumping wells. It has great significances to realize multiple fault diagnosis for actual oilfield production. In this paper, the extension theory is used to build a matter-element model to describe the fault diagnosis problem of the sucker rod pumping wells. The correlation function is used to calculate the correlation degree between the diagnostic fault and many standard fault types. The diagnosed sample and many possible fault types are divided into different combinations according to the correlation degree; the F-statistics of each combination is calculated and the “unbiased transformation” is used to find the mean of interval vectors. Larger F-statistics means greater differences within the faults classification; and the minimum F-statistics reflects the real multiple fault types. Case study shows the effectiveness of the proposed method.
2015-05-06
Cook, A., Wunderlich, H.-J..  2014.  Diagnosis of multiple faults with highly compacted test responses. Test Symposium (ETS), 2014 19th IEEE European. :1-6.

Defects cluster, and the probability of a multiple fault is significantly higher than just the product of the single fault probabilities. While this observation is beneficial for high yield, it complicates fault diagnosis. Multiple faults will occur especially often during process learning, yield ramp-up and field return analysis. In this paper, a logic diagnosis algorithm is presented which is robust against multiple faults and which is able to diagnose multiple faults with high accuracy even on compressed test responses as they are produced in embedded test and built-in self-test. The developed solution takes advantage of the linear properties of a MISR compactor to identify a set of faults likely to produce the observed faulty signatures. Experimental results show an improvement in accuracy of up to 22 % over traditional logic diagnosis solutions suitable for comparable compaction ratios.