Biblio

The Joint Test Action Group (JTAG) standards define test and debug architectures that are ingrained within much of today's commercial silicon. In particular, the IEEE Std. 1149.1 (Standard Test Access Port and Boundary Scan Architecture) forms the foundation of on-chip embedded instrumentation that is used extensively for everything from prototype board bring-up to firmware triage to field and depot system repair. More recently, JTAG is being used in-system as a hardware/firmware mechanism for Built-In Test (BIT), addressing No Fault Found (NFF) and materiel availability issues. Its power and efficacy are a direct outcome of being a ubiquitously available, embedded on-die instrument that is inherent in most electronic devices. While JTAG is indispensable for all aspects of test and debug, it suffers from a lack of inherent security. Unprotected, it can represent a security weakness, exposing a back-door vulnerability through which hackers can reverse engineer, extract sensitive data from, or disrupt systems. More explicitly, JTAG can be used to: - Read and write from system memory - Pause execution of firmware (by setting breakpoints) - Patch instructions or data in memory - Inject instructions directly into the pipeline of a target chip (without modifying memory) - Extract firmware (for reverse engineering/vulnerability research) - Execute private instructions to activate other engines within the chip As a low-level means of access to a powerful set of capabilities, the JTAG interface must be safeguarded against unauthorized intrusions and attacks. One method used to protect platforms against such attacks is to physically fuse off the JTAG Test Access Ports, either at the integrated circuit or the board level. But, given JTAG's utility, alternative approaches that allow for both security and debug have become available, especially if there is a hardware root of trust on the platform. These options include chip lock and key registers, challenge-response mechanisms, secure key systems, TDI/TDO encryption, and other authentication/authorization techniques. This paper reviews the options for safe access to JTAG-based debug and test embedded instrumentation.

Scan-based test is commonly used to increase testability and fault coverage, however, it is also known to be a liability for chip security. Research has shown that intellectual property (IP) or secret keys can be leaked through scan-based attacks. In this paper, we propose a dynamically-obfuscated scan design for protecting IPs against scan-based attacks. By perturbing all test patterns/responses and protecting the obfuscation key, the proposed architecture is proven to be robust against existing non-invasive scan attacks, and can protect all scan data from attackers in foundry, assembly, and system developers (i.e., OEMs) without compromising the testability. Furthermore, the proposed architecture can be easily plugged into EDA generated scan chains without having a noticeable impact on conventional integrated circuit (IC) design, manufacturing, and test flow. Finally, detailed security and experimental analyses have been performed on several benchmarks. The results demonstrate that the proposed method can protect chips from existing brute force, differential, and other scan-based attacks that target the obfuscation key. The proposed design is of low overhead on area, power consumption, and pattern generation time, and there is no impact on test time.