Biblio
The implication of Cyber-Physical Systems (CPS) in critical infrastructures (e.g., smart grids, water distribution networks, etc.) has introduced new security issues and vulnerabilities to those systems. In this paper, we demonstrate that black-box system identification using Support Vector Regression (SVR) can be used efficiently to build a model of a given industrial system even when this system is protected with a watermark-based detector. First, we briefly describe the Tennessee Eastman Process used in this study. Then, we present the principal of detection scheme and the theory behind SVR. Finally, we design an efficient black-box SVR algorithm for the Tennessee Eastman Process. Extensive simulations prove the efficiency of our proposed algorithm.
The roll-out of smart meters (SMs) in the electric grid has enabled data-driven grid management and planning techniques. SM data can be used together with short-term load forecasts (STLFs) to overcome polling frequency constraints for better grid management. However, the use of SMs that report consumption data at high spatial and temporal resolutions entails consumer privacy risks, motivating work in protecting consumer privacy. The impact of privacy protection schemes on STLF accuracy is not well studied, especially for smaller aggregations of consumers, whose load profiles are subject to more volatility and are, thus, harder to predict. In this paper, we analyse the impact of two user demand shaping privacy protection schemes, model-distribution predictive control (MDPC) and load-levelling, on STLF accuracy. Support vector regression is used to predict the load profiles at different consumer aggregation levels. Results indicate that, while the MDPC algorithm marginally affects forecast accuracy for smaller consumer aggregations, this diminishes at higher aggregation levels. More importantly, the load-levelling scheme significantly improves STLF accuracy as it smoothens out the grid visible consumer load profile.
The monitoring circuit is widely applied in radiation environment and it is of significance to study the circuit reliability with the radiation effects. In this paper, an intelligent analysis method based on Deep Belief Network (DBN) and Support Vector Method is proposed according to the radiation experiments analysis of the monitoring circuit. The Total Ionizing Dose (TID) of the monitoring circuit is used to identify the circuit degradation trend. Firstly, the output waveforms of the monitoring circuit are obtained by radiating with the different TID. Subsequently, the Deep Belief Network Model is trained to extract the features of the circuit signal. Finally, the Support Vector Machine (SVM) and Support Vector Regression (SVR) are applied to classify and predict the remaining useful life (RUL) of the monitoring circuit. According to the experimental results, the performance of DBN-SVM exceeds DBN method for feature extraction and classification, and SVR is effective for predicting the degradation.