Biblio

Integrated circuits (ICs) are becoming vulnerable to hardware Trojans. Most of existing works require golden chips to provide references for hardware Trojan detection. However, a golden chip is extremely difficult to obtain. In previous work, we have proposed a classification-based golden chips-free hardware Trojan detection technique. However, the algorithm in the previous work are trained by simulated ICs without considering that there may be a shift which occurs between the simulation and the silicon fabrication. It is necessary to learn from actual silicon fabrication in order to obtain an accurate and effective classification model. We propose a co-training based hardware Trojan detection technique exploiting unlabeled fabricated ICs and inaccurate simulation models, to provide reliable detection capability when facing fabricated ICs, while eliminating the need of fabricated golden chips. First, we train two classification algorithms using simulated ICs. During test-time, the two algorithms can identify different patterns in the unlabeled ICs, and thus be able to label some of these ICs for the further training of the another algorithm. Moreover, we use a statistical examination to choose ICs labeling for the another algorithm in order to help prevent a degradation in performance due to the increased noise in the labeled ICs. We also use a statistical technique for combining the hypotheses from the two classification algorithms to obtain the final decision. The theoretical basis of why the co-training method can work is also described. Experiment results on benchmark circuits show that the proposed technique can detect unknown Trojans with high accuracy (92% 97%) and recall (88% 95%).