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2021-01-22
Ayoade, G., Akbar, K. A., Sahoo, P., Gao, Y., Agarwal, A., Jee, K., Khan, L., Singhal, A..  2020.  Evolving Advanced Persistent Threat Detection using Provenance Graph and Metric Learning. 2020 IEEE Conference on Communications and Network Security (CNS). :1—9.

Advanced persistent threats (APT) have increased in recent times as a result of the rise in interest by nation-states and sophisticated corporations to obtain high profile information. Typically, APT attacks are more challenging to detect since they leverage zero-day attacks and common benign tools. Furthermore, these attack campaigns are often prolonged to evade detection. We leverage an approach that uses a provenance graph to obtain execution traces of host nodes in order to detect anomalous behavior. By using the provenance graph, we extract features that are then used to train an online adaptive metric learning. Online metric learning is a deep learning method that learns a function to minimize the separation between similar classes and maximizes the separation between dis-similar instances. We compare our approach with baseline models and we show our method outperforms the baseline models by increasing detection accuracy on average by 11.3 % and increases True positive rate (TPR) on average by 18.3 %.

2020-05-18
Lee, Hyun-Young, Kang, Seung-Shik.  2019.  Word Embedding Method of SMS Messages for Spam Message Filtering. 2019 IEEE International Conference on Big Data and Smart Computing (BigComp). :1–4.
SVM has been one of the most popular machine learning method for the binary classification such as sentiment analysis and spam message filtering. We explored a word embedding method for the construction of a feature vector and the deep learning method for the binary classification. CBOW is used as a word embedding technique and feedforward neural network is applied to classify SMS messages into ham or spam. The accuracy of the two classification methods of SVM and neural network are compared for the binary classification. The experimental result shows that the accuracy of deep learning method is better than the conventional machine learning method of SVM-light in the binary classification.