Biblio

Scanning Transmission Electron Microscopy (STEM) offers high-resolution images that are used to quantify the nanoscale atomic structure and composition of materials and biological specimens. In many cases, however, the resolution is limited by the electron beam damage, since in traditional STEM, a focused electron beam scans every location of the sample in a raster fashion. In this paper, we propose a scanning method based on the theory of Compressive Sensing (CS) and subsampling the electron probe locations using a line hop sampling scheme that significantly reduces the electron beam damage. We experimentally validate the feasibility of the proposed method by acquiring real CS-STEM data, and recovering images using a Bayesian dictionary learning approach. We support the proposed method by applying a series of masks to fully-sampled STEM data to simulate the expectation of real CS-STEM. Finally, we perform the real data experimental series using a constrained-dose budget to limit the impact of electron dose upon the results, by ensuring that the total electron count remains constant for each image.

We report on the significant enhancement of perpendicular magnetic anisotropy of Ni/NiO multilayers after mild annealing up to 90 min at 250 °C. Transmission electron microscopy shows that after annealing, a partial crystallization of the initially amorphous NiO layers occurs. This turns out to be the source of the anisotropy enhancement. Magnetic measurements reveal that even multilayers with Ni layers as thick as 7 nm, which in the as-deposited state showed inplane anisotropy with square hysteresis loops, show reduced in-plane remanence after thermal treatment. Hysteresis loops recorded with the field in the normal-to-film-plane direction provide evidence for perpendicular magnetic anisotropy with up and down magnetic domains at remanence. A plot of effective uniaxial magnetic anisotropy constant times individual Ni layer thickness as a function of individual Ni layer thickness shows a large change in the slope of the data attributed to a drastic change of volume anisotropy. Surface anisotropy showed a small decrease because of some layer roughening introduced by annealing.