Visible to the public Biblio

Filters: Keyword is hardware security metrics  [Clear All Filters]
2022-09-20
Koteshwara, Sandhya.  2021.  Security Risk Assessment of Server Hardware Architectures Using Graph Analysis. 2021 Asian Hardware Oriented Security and Trust Symposium (AsianHOST). :1—4.
The growing complexity of server architectures, which incorporate several components with state, has necessitated rigorous assessment of the security risk both during design and operation. In this paper, we propose a novel technique to model the security risk of servers by mapping their architectures to graphs. This allows us to leverage tools from computational graph theory, which we combine with probability theory for deriving quantitative metrics for risk assessment. Probability of attack is derived for server components, with prior probabilities assigned based on knowledge of existing vulnerabilities and countermeasures. The resulting analysis is further used to compute measures of impact and exploitability of attack. The proposed methods are demonstrated on two open-source server designs with different architectures.
2022-02-22
Duvalsaint, Danielle, Blanton, R. D. Shawn.  2021.  Characterizing Corruptibility of Logic Locks using ATPG. 2021 IEEE International Test Conference (ITC). :213–222.

The outsourcing of portions of the integrated circuit design chain, mainly fabrication, to untrusted parties has led to an increasing concern regarding the security of fabricated ICs. To mitigate these concerns a number of approaches have been developed, including logic locking. The development of different logic locking methods has influenced research looking at different security evaluations, typically aimed at uncovering a secret key. In this paper, we make the case that corruptibility for incorrect keys is an important metric of logic locking. To measure corruptibility for circuits too large to exhaustively simulate, we describe an ATPG-based method to measure the corruptibility of incorrect keys. Results from applying the method to various circuits demonstrate that this method is effective at measuring the corruptibility for different locks.