Biblio

The monitoring circuit is widely applied in radiation environment and it is of significance to study the circuit reliability with the radiation effects. In this paper, an intelligent analysis method based on Deep Belief Network (DBN) and Support Vector Method is proposed according to the radiation experiments analysis of the monitoring circuit. The Total Ionizing Dose (TID) of the monitoring circuit is used to identify the circuit degradation trend. Firstly, the output waveforms of the monitoring circuit are obtained by radiating with the different TID. Subsequently, the Deep Belief Network Model is trained to extract the features of the circuit signal. Finally, the Support Vector Machine (SVM) and Support Vector Regression (SVR) are applied to classify and predict the remaining useful life (RUL) of the monitoring circuit. According to the experimental results, the performance of DBN-SVM exceeds DBN method for feature extraction and classification, and SVR is effective for predicting the degradation.