Biblio

Any type of engineered design requires metrics for trading off both desirable and undesirable properties. For integrated circuits, typical properties include circuit size, performance, power, etc., where for example, performance is a desirable property and power consumption is not. Security metrics, on the other hand, are extremely difficult to develop because there are active adversaries that intend to compromise the protected circuitry. This implies metric values may not be static quantities, but instead are measures that degrade depending on attack effectiveness. In order to deal with this dynamic aspect of a security metric, a general attack model is proposed that enables the effectiveness of various security approaches to be directly compared in the context of an attack. Here, we describe, define and demonstrate that the metrics presented are both meaningful and measurable.

The outsourcing of portions of the integrated circuit design chain, mainly fabrication, to untrusted parties has led to an increasing concern regarding the security of fabricated ICs. To mitigate these concerns a number of approaches have been developed, including logic locking. The development of different logic locking methods has influenced research looking at different security evaluations, typically aimed at uncovering a secret key. In this paper, we make the case that corruptibility for incorrect keys is an important metric of logic locking. To measure corruptibility for circuits too large to exhaustively simulate, we describe an ATPG-based method to measure the corruptibility of incorrect keys. Results from applying the method to various circuits demonstrate that this method is effective at measuring the corruptibility for different locks.