Biblio

A hardware Trojan (HT) detection method is presented that is based on measuring and detecting small systematic changes in path delays introduced by capacitive loading effects or series inserted gates of HTs. The path delays are measured using a high resolution on-chip embedded test structure called a time-to-digital converter (TDC) that provides approx. 25 ps of timing resolution. A calibration method for the TDC as well as a chip-averaging technique are demonstrated to nearly eliminate chip-to-chip and within-die process variation effects on the measured path delays across chips. This approach significantly improves the correlation between Trojan-free chips and a simulation-based golden model. Path delay tests are applied to multiple copies of a 90nm custom ASIC chip having two copies of an AES macro. The AES macros are exact replicas except for the insertion of several additional gates in the second hardware copy, which are designed to model HTs. Simple statistical detection methods are used to isolate and detect systematic changes introduced by these additional gates. We present hardware results which demonstrate that our proposed chip-averaging and calibration techniques in combination with a single nominal simulation model can be used to detect small delay anomalies introduced by the inserted gates of hardware Trojans.