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Filters: Author is Phannachitta, P.  [Clear All Filters]
2017-12-28
Poon, W. N., Bennin, K. E., Huang, J., Phannachitta, P., Keung, J. W..  2017.  Cross-Project Defect Prediction Using a Credibility Theory Based Naive Bayes Classifier. 2017 IEEE International Conference on Software Quality, Reliability and Security (QRS). :434–441.

Several defect prediction models proposed are effective when historical datasets are available. Defect prediction becomes difficult when no historical data exist. Cross-project defect prediction (CPDP), which uses projects from other sources/companies to predict the defects in the target projects proposed in recent studies has shown promising results. However, the performance of most CPDP approaches are still beyond satisfactory mainly due to distribution mismatch between the source and target projects. In this study, a credibility theory based Naïve Bayes (CNB) classifier is proposed to establish a novel reweighting mechanism between the source projects and target projects so that the source data could simultaneously adapt to the target data distribution and retain its own pattern. Our experimental results show that the feasibility of the novel algorithm design and demonstrate the significant improvement in terms of the performance metrics considered achieved by CNB over other CPDP approaches.