Biblio

The evolution of convolutional neural networks (CNNs) into more complex forms of organization, with additional layers, larger convolutions and increasing connections, established the state-of-the-art in terms of accuracy errors for detection and classification challenges in images. Moreover, as they evolved to a point where Gigabytes of memory are required for their operation, we have reached a stage where it becomes fundamental to understand how their inference capabilities can be impaired if data elements somehow become corrupted in memory. This paper introduces fault-injection in these systems by simulating failing bit-cells in hardware memories brought on by relaxing the 100% reliable operation assumption. We analyze the behavior of these networks calculating inference under severe fault-injection rates and apply fault mitigation strategies to improve on the CNNs resilience. For the MNIST dataset, we show that 8x less memory is required for the feature maps memory space, and that in sub-100% reliable operation, fault-injection rates up to 10-1 (with most significant bit protection) can withstand only a 1% error probability degradation. Furthermore, considering the offload of the feature maps memory to an embedded dynamic RAM (eDRAM) system, using technology nodes from 65 down to 28 nm, up to 73 80% improved power efficiency can be obtained.