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Filters: Author is Zhang, Xian  [Clear All Filters]
2019-11-12
Zhang, Xian, Ben, Kerong, Zeng, Jie.  2018.  Cross-Entropy: A New Metric for Software Defect Prediction. 2018 IEEE International Conference on Software Quality, Reliability and Security (QRS). :111-122.

Defect prediction is an active topic in software quality assurance, which can help developers find potential bugs and make better use of resources. To improve prediction performance, this paper introduces cross-entropy, one common measure for natural language, as a new code metric into defect prediction tasks and proposes a framework called DefectLearner for this process. We first build a recurrent neural network language model to learn regularities in source code from software repository. Based on the trained model, the cross-entropy of each component can be calculated. To evaluate the discrimination for defect-proneness, cross-entropy is compared with 20 widely used metrics on 12 open-source projects. The experimental results show that cross-entropy metric is more discriminative than 50% of the traditional metrics. Besides, we combine cross-entropy with traditional metric suites together for accurate defect prediction. With cross-entropy added, the performance of prediction models is improved by an average of 2.8% in F1-score.