Biblio

As data security has become one of the most crucial issues in modern storage system/application designs, the data sanitization techniques are regarded as the promising solution on 3D NAND flash-memory-based devices. Many excellent works had been proposed to exploit the in-place reprogramming, erasure and encryption techniques to achieve and implement the sanitization functionalities. However, existing sanitization approaches could lead to performance, disturbance overheads or even deciphered issues. Different from existing works, this work aims at exploring an instantaneous data sanitization scheme by taking advantage of programming disturbance properties. Our proposed design can not only achieve the instantaneous data sanitization by exploiting programming disturbance and error correction code properly, but also enhance the performance with the recycling programming design. The feasibility and capability of our proposed design are evaluated by a series of experiments on 3D NAND flash memory chips, for which we have very encouraging results. The experiment results show that the proposed design could achieve the instantaneous data sanitization with low overhead; besides, it improves the average response time and reduces the number of block erase count by up to 86.8% and 88.8%, respectively.

As data security has become the major concern in modern storage systems with low-cost multi-level-cell (MLC) flash memories, it is not trivial to realize data sanitization in such a system. Even though some existing works employ the encryption or the built-in erase to achieve this requirement, they still suffer the risk of being deciphered or the issue of performance degradation. In contrast to the existing work, a fast sanitization scheme is proposed to provide the highest degree of security for data sanitization; that is, every old version of data could be immediately sanitized with zero live-data-copy overhead once the new version of data is created/written. In particular, this scheme further considers the reliability issue of MLC flash memories; the proposed scheme includes a one-shot sanitization design to minimize the disturbance during data sanitization. The feasibility and the capability of the proposed scheme were evaluated through extensive experiments based on real flash chips. The results demonstrate that this scheme can achieve the data sanitization with zero live-data-copy, where performance overhead is less than 1%.