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Filters: Author is Bailey, C.  [Clear All Filters]
2021-03-09
Herrera, A. E. Hinojosa, Walshaw, C., Bailey, C..  2020.  Improving Black Box Classification Model Veracity for Electronics Anomaly Detection. 2020 15th IEEE Conference on Industrial Electronics and Applications (ICIEA). :1092–1097.
Data driven classification models are useful to assess quality of manufactured electronics. Because decisions are taken based on the models, their veracity is relevant, covering aspects such as accuracy, transparency and clarity. The proposed BB-Stepwise algorithm aims to improve the classification model transparency and accuracy of black box models. K-Nearest Neighbours (KNN) is a black box model which is easy to implement and has achieved good classification performance in different applications. In this paper KNN-Stepwise is illustrated for fault detection of electronics devices. The results achieved shows that the proposed algorithm was able to improve the accuracy, veracity and transparency of KNN models and achieve higher transparency and clarity, and at least similar accuracy than when using Decision Tree models.