Biblio
The outsourcing of portions of the integrated circuit design chain, mainly fabrication, to untrusted parties has led to an increasing concern regarding the security of fabricated ICs. To mitigate these concerns a number of approaches have been developed, including logic locking. The development of different logic locking methods has influenced research looking at different security evaluations, typically aimed at uncovering a secret key. In this paper, we make the case that corruptibility for incorrect keys is an important metric of logic locking. To measure corruptibility for circuits too large to exhaustively simulate, we describe an ATPG-based method to measure the corruptibility of incorrect keys. Results from applying the method to various circuits demonstrate that this method is effective at measuring the corruptibility for different locks.
A technique of finding a set of sequential circuit nodes in which Trojan Circuits (TC) may be implanted is suggested. The technique is based on applying the precise (not heuristic) random estimations of internal node observability and controllability. Getting the estimations we at the same time derive and compactly represent all sequential circuit full states (depending on input and state variables) in which of that TC may be switched on. It means we obtain precise description of TC switch on area for the corresponding internal node v. The estimations are computed with applying a State Transition Graph (STG) description, if we suppose that TC may be inserted out of the working area (out of the specification) of the sequential circuit. Reduced Ordered Binary Decision Diagrams (ROBDDs) for the combinational part and its fragments are applied for getting the estimations by means of operations on ROBDDs. Techniques of masking TCs are proposed. Masking sub-circuits overhead is appreciated.