Biblio

The start-up value of an SRAM cell is unique, random, and unclonable as it is determined by the inherent process mismatch between transistors. These properties make SRAM an attractive circuit for generating encryption keys. The primary challenge for SRAM based key generation, however, is the poor stability when the circuit is subject to random noise, temperature and voltage changes, and device aging. Temporal majority voting (TMV) and bit masking were used in previous works to identify and store the location of unstable or marginally stable SRAM cells. However, TMV requires a long test time and significant hardware resources. In addition, the number of repetitive power-ups required to find the most stable cells is prohibitively high. To overcome the shortcomings of TMV, we propose a novel data remanence based technique to detect SRAM cells with the highest stability for reliable key generation. This approach requires only two remanence tests: writing `1' (or `0') to the entire array and momentarily shutting down the power until a few cells flip. We exploit the fact that the cells that are easily flipped are the most robust cells when written with the opposite data. The proposed method is more effective in finding the most stable cells in a large SRAM array than a TMV scheme with 1,000 power-up tests. Experimental studies show that the 256-bit key generated from a 512 kbit SRAM using the proposed data remanence method is 100% stable under different temperatures, power ramp up times, and device aging.

A physical unclonable function (PUF) is an integrated circuit (IC) that serves as a hardware security primitive due to its complexity and the unpredictability between its outputs and the applied inputs. PUFs have received a great deal of research interest and significant commercial activity. Public PUFs (PPUFs) address the crucial PUF limitation of being a secret-key technology. To some extent, the first generation of PPUFs are similar to SIMulation Possible, but Laborious (SIMPL) systems and one-time hardware pads, and employ the time gap between direct execution and simulation. The second PPUF generation employs both process variation and device aging which results in matched devices that are excessively difficult to replicate. The third generation leaves the analog domain and employs reconfigurability and device aging to produce digital PPUFs. We survey representative PPUF architectures, related public protocols and trusted information flows, and related testing issues. We conclude by identifying the most important, challenging, and open PPUF-related problems.