Biblio

An increasing number of industries around the world are adopting advance manufacturing technologies for product design, among which additive manufacturing (AM) is gaining attention among aerospace, defense, automotive and health care domains. Products with complicated designs demanding lesser weight, improved performance and conformance are manufactured by companies using AM technologies. Some noticeable examples of ducting, airflow system and vent products in the aerospace domain can be seen being made out of AM techniques. One of the benefits being mentioned is the significant reduction in the number of components going into a finished product, thereby impacting the supply chain as well. However, one of the challenges in AM process is to reduce the process variation which affects the reliability of the product. To realize the true benefits of additively manufactured products, it is imperative to ensure that the reliability of AM products is similar or better than traditionally manufactured products. Current state of art for assessing reliability of traditionally manufactured products is mature. However, the reliability assessment framework for products manufactured by advanced technologies are being studied upon. In this direction, this paper highlights a structured reliability assessment framework for additive manufactured products, which will help in identifying, analyzing and mitigating reliability risks as part of product development life cycle.

A hardware Trojan (HT) denotes the malicious addition or modification of circuit elements. The purpose of this work is to improve the HT detection sensitivity in ICs using power side-channel analysis. This paper presents three detection techniques in power based side-channel analysis by increasing Trojan-to-circuit power consumption and reducing the variation effect in the detection threshold. Incorporating the three proposed methods has demonstrated that a realistic fine-grain circuit partitioning and an improved pattern set to increase HT activation chances can magnify Trojan detectability.

Process Variation (PV) may cause accuracy loss of the analog neural network (ANN) processors, and make it hard to be scaled down, as well as feasibility degrading. This paper first analyses the impact of PV on the performance of ANN chips. Then proposes an in-situ transfer learning method at system level to reduce PV's influence with low-precision back-propagation. Simulation results show the proposed method could increase 50% tolerance of operating point drift and 70% $\sim$ 100% tolerance of mismatch with less than 1% accuracy loss of benchmarks. It also reduces 66.7% memories and has about 50× energy-efficiency improvement of multiplication in the learning stage, compared with the conventional full-precision (32bit float) training system.

In this paper an analog cellular neural network is proposed with application in physical unclonable function design. Dynamical behavior of the circuit and its high sensitivity to the process variation can be exploited in a challenge-response security system. The proposed circuit can be used as unclonable core module in the secure systems for applications such as device identification/authentication and secret key generation. The proposed circuit is designed and simulated in 45-nm bulk CMOS technology. Monte Carlo simulation for this circuit, results in unpolarized Gaussian-shaped distribution for Hamming Distance between 4005 100-bit PUF instances.

A physical unclonable function (PUF) is an integrated circuit (IC) that serves as a hardware security primitive due to its complexity and the unpredictability between its outputs and the applied inputs. PUFs have received a great deal of research interest and significant commercial activity. Public PUFs (PPUFs) address the crucial PUF limitation of being a secret-key technology. To some extent, the first generation of PPUFs are similar to SIMulation Possible, but Laborious (SIMPL) systems and one-time hardware pads, and employ the time gap between direct execution and simulation. The second PPUF generation employs both process variation and device aging which results in matched devices that are excessively difficult to replicate. The third generation leaves the analog domain and employs reconfigurability and device aging to produce digital PPUFs. We survey representative PPUF architectures, related public protocols and trusted information flows, and related testing issues. We conclude by identifying the most important, challenging, and open PPUF-related problems.