Visible to the public Biblio

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2020-02-26
Crouch, Alfred L, Ley, Adam W.  2019.  A Role for Embedded Instrumentation in Real-Time Hardware Assurance and Online Monitoring against Cybersecurity Threats. 2019 IEEE AUTOTESTCON. :1–9.

Jeopardy to cybersecurity threats in electronic systems is persistent and growing. Such threats present in hardware, by means such as Trojans and counterfeits, and in software, by means such as viruses and other malware. Against such threats, we propose a range of embedded instruments that are capable of real-time hardware assurance and online monitoring.

2020-01-20
Thiemann, Benjamin, Feiten, Linus, Raiola, Pascal, Becker, Bernd, Sauer, Matthias.  2019.  On Integrating Lightweight Encryption in Reconfigurable Scan Networks. 2019 IEEE European Test Symposium (ETS). :1–6.

Reconfigurable Scan Networks (RSNs) are a powerful tool for testing and maintenance of embedded systems, since they allow for flexible access to on-chip instrumentation such as built-in self-test and debug modules. RSNs, however, can be also exploited by malicious users as a side-channel in order to gain information about sensitive data or intellectual property and to recover secret keys. Hence, implementing appropriate counter-measures to secure the access to and data integrity of embedded instrumentation is of high importance. In this paper we present a novel hardware and software combined approach to ensure data privacy in IEEE Std 1687 (IJTAG) RSNs. To do so, both a secure IJTAG compliant plug-and-play instrument wrapper and a versatile software toolchain are introduced. The wrapper demonstrates the necessary architectural adaptations required when using a lightweight stream cipher, whereas the software toolchain provides a seamless integration of the testing workflow with stream cipher. The applicability of the method is demonstrated by an FPGA-based implementation. We report on the performance of the developed instrument wrapper, which is empirically shown to have only a small impact on the workflow in terms of hardware overhead, operational costs and test time overhead.