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2020-02-10
Tsai, I-Chun, Zhong, Yi, Liu, Fang-Ru, Feng, Jianhua.  2019.  A Novel Security Assessment Method Based on Linear Regression for Logic Locking. 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC). :1–3.
This paper presents a novel logic locking security assessment method based on linear regression, by means of modeling between the distribution probabilities of key-inputs and observable outputs. The algorithm reveals a weakness of the encrypted circuit since the assessment can revoke the key-inputs within several iterations. The experiment result shows that the proposed assessment can be applied to varies of encrypted combinational benchmark circuits, which exceeds 85% of correctness after revoking the encrypted key-inputs.