| Title | A Novel Security Assessment Method Based on Linear Regression for Logic Locking |
| Publication Type | Conference Paper |
| Year of Publication | 2019 |
| Authors | Tsai, I-Chun, Zhong, Yi, Liu, Fang-Ru, Feng, Jianhua |
| Conference Name | 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) |
| Keywords | composability, cryptography, distribution probabilities, encrypted circuit, encrypted combinational benchmark circuits, encrypted key-inputs, hardware security, key-inputs modeling, linear regression, logic locking, logic locking security assessment method, Microelectronics Security, multiple linear regression, Predictive Metrics, probability, pubcrawl, Resiliency, security assessment |
| Abstract | This paper presents a novel logic locking security assessment method based on linear regression, by means of modeling between the distribution probabilities of key-inputs and observable outputs. The algorithm reveals a weakness of the encrypted circuit since the assessment can revoke the key-inputs within several iterations. The experiment result shows that the proposed assessment can be applied to varies of encrypted combinational benchmark circuits, which exceeds 85% of correctness after revoking the encrypted key-inputs. |
| DOI | 10.1109/EDSSC.2019.8754415 |
| Citation Key | tsai_novel_2019 |
A Novel Security Assessment Method Based on Linear Regression for Logic Locking