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Cyber-Physical Systems Virtual Organization

Read-only archive of site from September 29, 2023.

CPS-VO

faulty modules

biblio

Visible to the public Process Metrics Are Not Bad Predictors of Fault Proneness

Submitted by grigby1 on Thu, 12/28/2017 - 1:30pm
  • Niobium
  • Trusted Computing
  • trust-worthy predictions
  • statistical analysis
  • static code metrics
  • software quality
  • software metrics
  • pubcrawl
  • process metrics
  • predictive security metrics
  • Predictive models
  • Predictive Metrics
  • prediction
  • pattern classification
  • Bayes methods
  • Naive Bayes
  • Metrics
  • Inspection
  • faulty modules
  • faulty classes
  • faults
  • fault/defect prediction models
  • fault proneness
  • fault prediction performance evaluation
  • Couplings
  • classifier
  • box plot visual inspection

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