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Cyber-Physical Systems Virtual Organization

Read-only archive of site from September 29, 2023.

CPS-VO

classification model transparency

biblio

Visible to the public Improving Black Box Classification Model Veracity for Electronics Anomaly Detection

Submitted by aekwall on Tue, 03/09/2021 - 12:05pm
  • electronics anomaly detection
  • fault detection
  • KNN
  • BB-stepwise algorithm
  • black box
  • black box classification model veracity
  • black box model
  • classification model transparency
  • data driven classification models
  • decision tree models
  • fault diagnosis
  • electronics devices
  • electronics industry
  • higher transparency
  • Industrial electronics
  • KNN models
  • KNN-stepwise
  • manufactured electronics
  • Stepwise
  • Metrics
  • performance evaluation
  • Classification algorithms
  • Data models
  • nearest neighbour methods
  • feature extraction
  • learning (artificial intelligence)
  • Resiliency
  • pubcrawl
  • composability
  • Conferences
  • pattern classification
  • manufacturing systems
  • production engineering computing
  • black box encryption
  • Decision trees
  • classification
  • Veracity
  • Feature Selection

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