Biblio

Dynamic memory allocators are critical components of modern systems, and developers strive to find a balance between their performance and their security. Unfortunately, vulnerable allocators are routinely abused as building blocks in complex exploitation chains. Most of the research regarding memory allocators focuses on popular and standardized heap libraries, generally used by high-end devices such as desktop systems and servers. However, dynamic memory allocators are also extensively used in embedded systems but they have not received much scrutiny from the security community.In embedded systems, a raw firmware image is often the only available piece of information, and finding heap vulnerabilities is a manual and tedious process. First of all, recognizing a memory allocator library among thousands of stripped firmware functions can quickly become a daunting task. Moreover, emulating firmware functions to test for heap vulnerabilities comes with its own set of challenges, related, but not limited, to the re-hosting problem.To fill this gap, in this paper we present HEAPSTER, a system that automatically identifies the heap library used by a monolithic firmware image, and tests its security with symbolic execution and bounded model checking. We evaluate HEAPSTER on a dataset of 20 synthetic monolithic firmware images — used as ground truth for our analyses — and also on a dataset of 799 monolithic firmware images collected in the wild and used in real-world devices. Across these datasets, our tool identified 11 different heap management library (HML) families containing a total of 48 different variations. The security testing performed by HEAPSTER found that all the identified variants are vulnerable to at least one critical heap vulnerability. The results presented in this paper show a clear pattern of poor security standards, and raise some concerns over the security of dynamic memory allocators employed by IoT devices.

Internet of Things (IoT) devices have rooted themselves in the everyday life of billions of people. Thus, researchers have applied automated bug finding techniques to improve their overall security. However, due to the difficulties in extracting and emulating custom firmware, black-box fuzzing is often the only viable analysis option. Unfortunately, this solution mostly produces invalid inputs, which are quickly discarded by the targeted IoT device and do not penetrate its code. Another proposed approach is to leverage the companion app (i.e., the mobile app typically used to control an IoT device) to generate well-structured fuzzing inputs. Unfortunately, the existing solutions produce fuzzing inputs that are constrained by app-side validation code, thus significantly limiting the range of discovered vulnerabilities.In this paper, we propose a novel approach that overcomes these limitations. Our key observation is that there exist functions inside the companion app that can be used to generate optimal (i.e., valid yet under-constrained) fuzzing inputs. Such functions, which we call fuzzing triggers, are executed before any data-transforming functions (e.g., network serialization), but after the input validation code. Consequently, they generate inputs that are not constrained by app-side sanitization code, and, at the same time, are not discarded by the analyzed IoT device due to their invalid format. We design and develop Diane, a tool that combines static and dynamic analysis to find fuzzing triggers in Android companion apps, and then uses them to fuzz IoT devices automatically. We use Diane to analyze 11 popular IoT devices, and identify 11 bugs, 9 of which are zero days. Our results also show that without using fuzzing triggers, it is not possible to generate bug-triggering inputs for many devices.