| Title | On-Device Detection via Anomalous Environmental Factors |
| Publication Type | Conference Paper |
| Year of Publication | 2018 |
| Authors | Gautier, Adam M., Andel, Todd R., Benton, Ryan |
| Conference Name | Proceedings of the 8th Software Security, Protection, and Reverse Engineering Workshop |
| Publisher | ACM |
| Conference Location | New York, NY, USA |
| ISBN Number | 978-1-4503-6096-8 |
| Keywords | anomaly detection, composability, Embedded systems, field programmable gate arrays, Metrics, pubcrawl, Resiliency, Ring oscillators, sensor systems and applications, Temperature sensors |
| Abstract | Embedded Systems (ES) underlie society's critical cyberinfrastructure and comprise the vast majority of consumer electronics, making them a prized target for dangerous malware and hardware Trojans. Malicious intrusion into these systems present a threat to national security and economic stability as globalized supply chains and tight network integration make ES more susceptible to attack than ever. High-end ES like the Xilinx Zynq-7020 system on a chip are widely used in the field and provide a representative platform for investigating the methods of cybercriminals. This research suggests a novel anomaly detection framework that could be used to detect potential zero-day exploits, undiscovered rootkits, or even maliciously implanted hardware by leveraging the Zynq architecture and real-time device-level measurements of thermal side-channels. The results of an initial investigation showed different processor workloads produce distinct thermal fingerprints that are detectable by out-of-band, digital logic-based thermal sensors. |
| URL | http://doi.acm.org/10.1145/3289239.3289246 |
| DOI | 10.1145/3289239.3289246 |
| Citation Key | gautier_-device_2018 |
On-Device Detection via Anomalous Environmental Factors