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Filters: Author is Sun, Maolin  [Clear All Filters]
2023-03-31
Yang, Jing, Yang, Yibiao, Sun, Maolin, Wen, Ming, Zhou, Yuming, Jin, Hai.  2022.  Isolating Compiler Optimization Faults via Differentiating Finer-grained Options. 2022 IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER). :481–491.

Code optimization is an essential feature for compilers and almost all software products are released by compiler optimizations. Consequently, bugs in code optimization will inevitably cast significant impact on the correctness of software systems. Locating optimization bugs in compilers is challenging as compilers typically support a large amount of optimization configurations. Although prior studies have proposed to locate compiler bugs via generating witness test programs, they are still time-consuming and not effective enough. To address such limitations, we propose an automatic bug localization approach, ODFL, for locating compiler optimization bugs via differentiating finer-grained options in this study. Specifically, we first disable the fine-grained options that are enabled by default under the bug-triggering optimization levels independently to obtain bug-free and bug-related fine-grained options. We then configure several effective passing and failing optimization sequences based on such fine-grained options to obtain multiple failing and passing compiler coverage. Finally, such generated coverage information can be utilized via Spectrum-Based Fault Localization formulae to rank the suspicious compiler files. We run ODFL on 60 buggy GCC compilers from an existing benchmark. The experimental results show that ODFL significantly outperforms the state-of-the-art compiler bug isolation approach RecBi in terms of all the evaluated metrics, demonstrating the effectiveness of ODFL. In addition, ODFL is much more efficient than RecBi as it can save more than 88% of the time for locating bugs on average.

ISSN: 1534-5351