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Cyber-Physical Systems Virtual Organization
Read-only archive of site from September 29, 2023.
CPS-VO
Double stuck-at faults
biblio
Automatic Test Pattern Generation of Multiple stuck-at faults using Test Patterns of Single stuck-at faults
Submitted by aekwall on Tue, 03/08/2022 - 2:37pm
Single stuck-at faults
Multiple stuck-at faults
Double stuck-at faults
automatic test pattern generation
Market research
Informatics
cyber-physical systems
Resiliency
Metrics
pubcrawl
Circuit faults
Human Factors
multiple fault diagnosis
Test pattern generators
