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automatic test pattern generation

biblio

High-level Intellectual Property Obfuscation via Decoy Constants

Submitted by grigby1 on Wed, 06/08/2022 - 10:21am

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Automatic Test Pattern Generation of Multiple stuck-at faults using Test Patterns of Single stuck-at faults

Submitted by aekwall on Tue, 03/08/2022 - 2:37pm

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Design Obfuscation versus Test

Submitted by aekwall on Mon, 10/04/2021 - 1:54pm

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Intra-Die-Variation-Aware Side Channel Analysis for Hardware Trojan Detection

Submitted by grigby1 on Wed, 04/11/2018 - 2:59pm

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Dynamically obfuscated scan for protecting IPs against scan-based attacks throughout supply chain

Submitted by grigby1 on Tue, 01/23/2018 - 3:21pm

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An efficient diagnosis method to deal with multiple fault-pairs simultaneously using a single circuit model

Submitted by BrandonB on Wed, 05/06/2015 - 2:32pm

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