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Cyber-Physical Systems Virtual Organization
Read-only archive of site from September 29, 2023.
CPS-VO
scan failure
biblio
Combining Enhanced Diagnostic-Driven Analysis Scheme and Static Near Infrared Photon Emission Microscopy for Effective Scan Failure Debug
Submitted by aekwall on Thu, 02/02/2023 - 3:23pm
integrated circuits
Software
Resiliency
Human behavior
composability
Product design
Inspection
static analysis
Foundries
pubcrawl
defect prediction (key words)
failure analysis
microscopy
photon emission microscopy
Scan Diagnosis
scan failure
