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Cyber-Physical Systems Virtual Organization
Read-only archive of site from September 29, 2023.
CPS-VO
Scan Diagnosis
biblio
Combining Enhanced Diagnostic-Driven Analysis Scheme and Static Near Infrared Photon Emission Microscopy for Effective Scan Failure Debug
Submitted by aekwall on Thu, 02/02/2023 - 3:23pm
integrated circuits
Software
Resiliency
Human behavior
composability
Product design
Inspection
static analysis
Foundries
pubcrawl
defect prediction (key words)
failure analysis
microscopy
photon emission microscopy
Scan Diagnosis
scan failure
biblio
Automated nets extraction for digital logic physical failure analysis on IP-secure products
Submitted by grigby1 on Wed, 08/11/2021 - 2:27pm
Layout
User-Defined Online Search (UDOS)
tools
Tool Command Language (TCL)
Scan Diagnosis
Resiliency
resilience
pubcrawl
policy-based governance
Open Artwork System Interchange Standard (OASIS)
Metallization
multiple fault diagnosis
KTMask Command (Program to send commands to the Synopsys Avalon MaskView tool)
KDB (Conversion of GDSII information in to Synopsys Avalon Database)
ip protection
Inspection
Graphic Database System (GDSII)
failure analysis
composability
collaboration
Circuit faults
Bridges
