Skip to Main Content Area
CPS-VO
Contact Support
Browse
Calendar
Announcements
Repositories
Groups
Search
Search for Content
Search for a Group
Search for People
Search for a Project
Tagcloud
› Go to login screen
Not a member?
Click here to register!
Forgot username or password?
Cyber-Physical Systems Virtual Organization
Read-only archive of site from September 29, 2023.
CPS-VO
March testing
biblio
Detection, diagnosis, and repair of faults in memristor-based memories
Submitted by BrandonB on Wed, 05/06/2015 - 2:33pm
Memristor
testing
test time
Sneak-paths
sneak-path free crossbar
Resistance
random-access storage
post-silicon recovery
nanoscale fabrication
multiple memory cells testing
memristors
memristor-based memories
memristor failures
Circuit faults
Memory
March testing
maintenance engineering
integrated circuits
hybrid diagnosis scheme
high defect densities
future memory architectures
faulty cell repairs
fault diagnosis
fault detection
crossbar memories
