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Cyber-Physical Systems Virtual Organization
Read-only archive of site from September 29, 2023.
CPS-VO
test time
biblio
Detection, diagnosis, and repair of faults in memristor-based memories
Submitted by BrandonB on Wed, 05/06/2015 - 2:33pm
Memristor
testing
test time
Sneak-paths
sneak-path free crossbar
Resistance
random-access storage
post-silicon recovery
nanoscale fabrication
multiple memory cells testing
memristors
memristor-based memories
memristor failures
Circuit faults
Memory
March testing
maintenance engineering
integrated circuits
hybrid diagnosis scheme
high defect densities
future memory architectures
faulty cell repairs
fault diagnosis
fault detection
crossbar memories
