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National Science Foundation

Cyber-Physical Systems Virtual Organization

Read-only archive of site from September 29, 2023.

CPS-VO

untrusted assembly packaging and test

biblio

Visible to the public A Novel PUF Based SST to Prevent Distribution of Rejected ICs from Untrusted Assembly

Submitted by grigby1 on Wed, 03/08/2017 - 2:33pm
  • intellectual property infringement
  • untrusted assembly packaging and test
  • security issue
  • secure split test
  • rejected IC distribution
  • PUF based SST
  • pubcrawl170112
  • Physical Unclonable Function
  • partially functional chip
  • intellectual property rights
  • connecticut sst
  • integrated circuit manufacture
  • integrated circuit cloning
  • Information systems
  • industrial property
  • hardware metering
  • faulty chip
  • counterfeiting
  • copy protection

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