A subthreshold 30pJ/bit self-timed ring based true random number generator for internet of everything
| Title | A subthreshold 30pJ/bit self-timed ring based true random number generator for internet of everything |
| Publication Type | Conference Paper |
| Year of Publication | 2017 |
| Authors | Coustans, M., Terrier, C., Eberhardt, T., Salgado, S., Cherkaoui, A., Fesquet, L. |
| Conference Name | 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) |
| Date Published | oct |
| ISBN Number | 978-1-5386-3766-1 |
| Keywords | CMOS analogue integrated circuits, CMOS flash process, composability, cryptography, Entropy, FIPS 140-2, Generators, high quality random bit sequences, integrated circuit design, Internet of Everything, Internet of Things, inverter based ring oscillator, Jitter, Logic gates, Metrics, Microelectronics Security, NIST, NIST SP 800-22 statistical tests, Noise, oscillator, Oscillators, physics based entropy source, pubcrawl, PVT variation, random number generation, random number generator, resilience, Resiliency, Ring oscillators, security, size 180.0 nm, statistical testing, subthreshold self-timed ring, true random number generator (TRNG) |
| Abstract | This paper presents a true random number generator that exploits the subthreshold properties of jitter of events propagating in a self-timed ring and jitter of events propagating in an inverter based ring oscillator. Design was implemented in 180nm CMOS flash process. Devices provide high quality random bit sequences passing FIPS 140-2 and NIST SP 800-22 statistical tests which guaranty uniform distribution and unpredictability thanks to the physics based entropy source. |
| URL | https://ieeexplore.ieee.org/document/8308742/ |
| DOI | 10.1109/S3S.2017.8308742 |
| Citation Key | coustans_subthreshold_2017 |
- resilience
- Noise
- oscillator
- Oscillators
- physics based entropy source
- pubcrawl
- PVT variation
- random number generation
- random number generator
- NIST SP 800-22 statistical tests
- Resiliency
- Ring oscillators
- security
- size 180.0 nm
- statistical testing
- subthreshold self-timed ring
- true random number generator (TRNG)
- Internet of Everything
- CMOS flash process
- composability
- Cryptography
- Entropy
- FIPS 140-2
- Generators
- high quality random bit sequences
- integrated circuit design
- CMOS analogue integrated circuits
- Internet of Things
- inverter based ring oscillator
- Jitter
- Logic gates
- Metrics
- Microelectronics Security
- NIST