Visible to the public Biblio

Filters: Author is Drechsler, R.  [Clear All Filters]
2021-03-29
Pieper, P., Herdt, V., Große, D., Drechsler, R..  2020.  Dynamic Information Flow Tracking for Embedded Binaries using SystemC-based Virtual Prototypes. 2020 57th ACM/IEEE Design Automation Conference (DAC). :1—6.

Avoiding security vulnerabilities is very important for embedded systems. Dynamic Information Flow Tracking (DIFT) is a powerful technique to analyze SW with respect to security policies in order to protect the system against a broad range of security related exploits. However, existing DIFT approaches either do not exist for Virtual Prototypes (VPs) or fail to model complex hardware/software interactions.In this paper, we present a novel approach that enables early and accurate DIFT of binaries targeting embedded systems with custom peripherals. Leveraging the SystemC framework, our DIFT engine tracks accurate data flow information alongside the program execution to detect violations of security policies at run-time. We demonstrate the effectiveness and applicability of our approach by extensive experiments.

2020-11-09
Saeed, S. M., Cui, X., Zulehner, A., Wille, R., Drechsler, R., Wu, K., Karri, R..  2018.  IC/IP Piracy Assessment of Reversible Logic. 2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD). :1–8.
Reversible logic is a building block for adiabatic and quantum computing in addition to other applications. Since common functions are non-reversible, one needs to embed them into proper-size reversible functions by adding ancillary inputs and garbage outputs. We explore the Intellectual Property (IP) piracy of reversible circuits. The number of embeddings of regular functions in a reversible function and the percent of leaked ancillary inputs measure the difficulty of recovering the embedded function. To illustrate the key concepts, we study reversible logic circuits designed using reversible logic synthesis tools based on Binary Decision Diagrams and Quantum Multi-valued Decision Diagrams.