| Title | Debugger-driven Embedded Fuzzing |
| Publication Type | Conference Paper |
| Year of Publication | 2022 |
| Authors | Eisele, Max |
| Conference Name | 2022 IEEE Conference on Software Testing, Verification and Validation (ICST) |
| Keywords | composability, Computers, Conferences, Debugging, Embedded systems, fuzzing, Industries, Metrics, microcontrollers, pubcrawl, resilience, Resiliency, security testing |
| Abstract | Embedded Systems - the hidden computers in our lives - are deployed in the billionths and are already in the focus of attackers. They pose security risks when not tested and maintained thoroughly. In recent years, fuzzing has become a promising technique for automated security testing of programs, which can generate tons of test inputs for a program. Fuzzing is hardly applied to embedded systems, because of their high diversity and closed character. During my research I want tackle that gap in fuzzing embedded systems - short: "Embedded Fuzzing". My goal is to obtain insights of the embedded system during execution, by using common debugging interfaces and hardware breakpoints to enable guided fuzzing in a generic and widely applicable way. Debugging interfaces and hardware breakpoints are available for most common microcontrollers, generating a potential industry impact. Preliminary results show that the approach covers basic blocks faster than blackbox fuzzing. Additionally, it is source code agnostic and leaves the embedded firmware unaltered. |
| Notes | ISSN: 2159-4848 |
| DOI | 10.1109/ICST53961.2022.00062 |
| Citation Key | eisele_debugger-driven_2022 |
Debugger-driven Embedded Fuzzing