| Title | Automated nets extraction for digital logic physical failure analysis on IP-secure products |
| Publication Type | Conference Paper |
| Year of Publication | 2020 |
| Authors | Ngow, Y T, Goh, S H, Leo, J, Low, H W, Kamoji, Rupa |
| Conference Name | 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| Date Published | jul |
| Keywords | Bridges, Circuit faults, Collaboration, composability, failure analysis, Graphic Database System (GDSII), Inspection, ip protection, KDB (Conversion of GDSII information in to Synopsys Avalon Database), KTMask Command (Program to send commands to the Synopsys Avalon MaskView tool), Layout, Metallization, multiple fault diagnosis, Open Artwork System Interchange Standard (OASIS), policy-based governance, pubcrawl, resilience, Resiliency, Scan Diagnosis, Tool Command Language (TCL), Tools, User-Defined Online Search (UDOS) |
| Abstract | GDSII layouts of IP-confidential products are heavily controlled and access is only granted to certain privileged personnel. Failure analysts are generally excluded. Without guidance from GDSII, failure analysis, specifically physical inspection based on fault isolation findings cannot proceed. To overcome this challenge, we develop an automated approach that enables image snapshots relevant to failure analysts to be furnished without compromising the confidentiality of the GDSII content in this paper. Modules built are executed to trace the suspected nets and extract them into multiple images of different pre-defined frame specifications to facilitate failure analysis. |
| DOI | 10.1109/IPFA49335.2020.9260696 |
| Citation Key | ngow_automated_2020 |
Automated nets extraction for digital logic physical failure analysis on IP-secure products