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National Science Foundation

Cyber-Physical Systems Virtual Organization

Read-only archive of site from September 29, 2023.

CPS-VO

manufacturing testing

biblio

Visible to the public Detecting untestable hardware Trojan with non-intrusive concurrent on line testing

Submitted by grigby1 on Wed, 03/08/2017 - 2:32pm
  • manufacturing testing
  • untestable hardware trojan
  • Trojan horses
  • security
  • Radiation detectors
  • pubcrawl170112
  • nonintrusive concurrent on line testing
  • Monitoring
  • microprocessor chips
  • built-in self-test
  • manufacturing stage
  • manufacturing cycle
  • integrated circuit testing
  • HT
  • Hardware
  • Europe
  • circuit geometrical characteristics
  • chip supply chain

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