Detecting untestable hardware Trojan with non-intrusive concurrent on line testing
Title | Detecting untestable hardware Trojan with non-intrusive concurrent on line testing |
Publication Type | Conference Paper |
Year of Publication | 2015 |
Authors | Voyiatzis, I., Sgouropoulou, C., Estathiou, C. |
Conference Name | 2015 10th International Conference on Design Technology of Integrated Systems in Nanoscale Era (DTIS) |
Date Published | apr |
Keywords | built-in self-test, chip supply chain, circuit geometrical characteristics, Europe, Hardware, HT, integrated circuit testing, manufacturing cycle, manufacturing stage, manufacturing testing, microprocessor chips, Monitoring, nonintrusive concurrent on line testing, pubcrawl170112, Radiation detectors, security, Trojan horses, untestable hardware trojan |
Abstract | Hardware Trojans are an emerging threat that intrudes in the design and manufacturing cycle of the chips and has gained much attention lately due to the severity of the problems it draws to the chip supply chain. Hardware Typically, hardware Trojans are not detected during the usual manufacturing testing due to the fact that they are activated as an effect of a rare event. A class of published HTs are based on the geometrical characteristics of the circuit and claim to be undetectable, in the sense that their activation cannot be detected. In this work we study the effect of continuously monitoring the inputs of the module under test with respect to the detection of HTs possibly inserted in the module, either in the design or the manufacturing stage. |
DOI | 10.1109/DTIS.2015.7127369 |
Citation Key | voyiatzis_detecting_2015 |
- manufacturing testing
- untestable hardware trojan
- Trojan horses
- security
- Radiation detectors
- pubcrawl170112
- nonintrusive concurrent on line testing
- Monitoring
- microprocessor chips
- built-in self-test
- manufacturing stage
- manufacturing cycle
- integrated circuit testing
- HT
- Hardware
- Europe
- circuit geometrical characteristics
- chip supply chain