| Title | Cross-Layer Soft-Error Resilience Analysis of Computing Systems |
| Publication Type | Conference Paper |
| Year of Publication | 2020 |
| Authors | Bosio, Alberto, Canal, Ramon, Di Carlo, Stefano, Gizopoulos, Dimitris, Savino, Alessandro |
| Conference Name | 2020 50th Annual IEEE-IFIP International Conference on Dependable Systems and Networks-Supplemental Volume (DSN-S) |
| Date Published | July 2020 |
| Publisher | IEEE |
| ISBN Number | 978-1-7281-7260-6 |
| Keywords | Circuit faults, CPS Resilience, cyber physical systems, Hardware, n/a, pubcrawl, Reliability engineering, resilience, Resiliency, software reliability, Tutorials |
| Abstract | In a world with computation at the epicenter of every activity, computing systems must be highly resilient to errors even if miniaturization makes the underlying hardware unreliable. Techniques able to guarantee high reliability are associated to high costs. Early resilience analysis has the potential to support informed design decisions to maximize system-level reliability while minimizing the associated costs. This tutorial focuses on early cross-layer (hardware and software) resilience analysis considering the full computing continuum (from IoT/CPS to HPC applications) with emphasis on soft errors. |
| URL | https://ieeexplore.ieee.org/document/9159134 |
| DOI | 10.1109/DSN-S50200.2020.00042 |
| Citation Key | bosio_cross-layer_2020 |
Cross-Layer Soft-Error Resilience Analysis of Computing Systems