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Cyber-Physical Systems Virtual Organization
Read-only archive of site from September 29, 2023.
CPS-VO
Manufacturing test
biblio
LL-ATPG: Logic-Locking Aware Test Using Valet Keys in an Untrusted Environment
Submitted by grigby1 on Fri, 07/29/2022 - 9:44am
supply chains
pattern locks
untrusted foundry
Manufacturing test
logic locking
design for testability
Costs
Semiconductor device modeling
reverse engineering
Logic gates
manufacturing
Scalability
system-on-chip
Resiliency
resilience
Human behavior
pubcrawl
