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Cyber-Physical Systems Virtual Organization
Read-only archive of site from September 29, 2023.
CPS-VO
TPG
biblio
Secured Test Pattern Generators for BIST
Submitted by grigby1 on Fri, 07/29/2022 - 9:44am
intellectual property
pattern locks
TPG
overproduction
BIST
logic locking
design for testability
built-in self-test
Hardware Security
reverse engineering
pubcrawl
side-channel attacks
integrated circuits
privacy
Scalability
Hardware
Resiliency
resilience
Human behavior
