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Cyber-Physical Systems Virtual Organization
Read-only archive of site from September 29, 2023.
CPS-VO
Interconnect opens
biblio
Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model
Submitted by grigby1 on Wed, 12/20/2017 - 7:51pm
Logic gates
unknown values
test generation
SMT
Robustness
robust enhanced aggressor victim model
Resiliency
pubcrawl
privacy
physical failure analysis
oscillating behaviors
open faults
nanotechnology
nanoscale technologies
Metrics
ATPG
Interconnect opens
interconnect open defects
integrated circuit modelling
Integrated circuit modeling
Integrated circuit interconnections
failure analysis
electrical parameters
diagnostic classification algorithm
diagnose
Couplings
composability
Circuit faults
Capacitance
automatic test pattern generation
