Skip to Main Content Area
  • CPS-VO
    • Contact Support
  • Browse
    • Calendar
    • Announcements
    • Repositories
    • Groups
  • Search
    • Search for Content
    • Search for a Group
    • Search for People
    • Search for a Project
    • Tagcloud
      
 
Not a member?
Click here to register!
Forgot username or password?
 
Home
National Science Foundation

Cyber-Physical Systems Virtual Organization

Read-only archive of site from September 29, 2023.

CPS-VO

ATPG

biblio

Visible to the public Is Robust Design-for-Security Robust Enough? Attack on Locked Circuits with Restricted Scan Chain Access

Submitted by aekwall on Tue, 09/08/2020 - 9:59am
  • locked circuits
  • Chained Attacks
  • working chip
  • unauthorized scan access
  • secret key recovery
  • scan chain
  • SAT attack
  • robust DFS technique
  • robust DFS design
  • robust design-for-security architecture
  • restricted scan chain access
  • logic locking security
  • logic locking attacks
  • Scalability
  • IP piracy
  • Boolean satisfiability based attack
  • benchmark circuits
  • ATPG
  • Boolean functions
  • logic circuits
  • computability
  • Security analysis
  • logic locking
  • pubcrawl
  • Resiliency
  • Cryptography
biblio

Visible to the public Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model

Submitted by grigby1 on Wed, 12/20/2017 - 8:51pm
  • Logic gates
  • unknown values
  • test generation
  • SMT
  • Robustness
  • robust enhanced aggressor victim model
  • Resiliency
  • pubcrawl
  • privacy
  • physical failure analysis
  • oscillating behaviors
  • open faults
  • nanotechnology
  • nanoscale technologies
  • Metrics
  • ATPG
  • Interconnect opens
  • interconnect open defects
  • integrated circuit modelling
  • Integrated circuit modeling
  • Integrated circuit interconnections
  • failure analysis
  • electrical parameters
  • diagnostic classification algorithm
  • diagnose
  • Couplings
  • composability
  • Circuit faults
  • Capacitance
  • automatic test pattern generation

Terms of Use  |  ©2023. CPS-VO