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National Science Foundation

Cyber-Physical Systems Virtual Organization

Read-only archive of site from September 29, 2023.

CPS-VO

DRAM vendors

biblio

Visible to the public PAIR: Pin-aligned In-DRAM ECC architecture using expandability of Reed-Solomon code

Submitted by aekwall on Mon, 03/22/2021 - 1:09pm
  • In-DRAM ECC
  • Resiliency
  • Reliability
  • Reed-Solomon codes
  • Reed-Solomon code
  • pubcrawl
  • process scaling
  • pin-aligned In-DRAM ECC architecture
  • performance degradation
  • PAIR
  • numerous inherent faults
  • In-DRAM Error Correcting Code
  • Compositionality
  • expandability
  • error correction codes
  • error correction
  • ECC codewords
  • DRAM vendors
  • DRAM chips
  • DRAM
  • DQ pin lines
  • density
  • computer systems

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