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Cyber-Physical Systems Virtual Organization
Read-only archive of site from September 29, 2023.
CPS-VO
ECC codewords
biblio
PAIR: Pin-aligned In-DRAM ECC architecture using expandability of Reed-Solomon code
Submitted by aekwall on Mon, 03/22/2021 - 1:09pm
In-DRAM ECC
Resiliency
Reliability
Reed-Solomon codes
Reed-Solomon code
pubcrawl
process scaling
pin-aligned In-DRAM ECC architecture
performance degradation
PAIR
numerous inherent faults
In-DRAM Error Correcting Code
Compositionality
expandability
error correction codes
error correction
ECC codewords
DRAM vendors
DRAM chips
DRAM
DQ pin lines
density
computer systems
