Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization
Title | Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization |
Publication Type | Journal Article |
Year of Publication | 2014 |
Authors | Kundu, S., Jha, A., Chattopadhyay, S., Sengupta, I., Kapur, R. |
Journal | Very Large Scale Integration (VLSI) Systems, IEEE Transactions on |
Volume | 22 |
Pagination | 696-700 |
Date Published | March |
ISSN | 1063-8210 |
Keywords | Automatic test pattern generation (ATPG), effect-cause analysis, fault diagnosis, fault simulation, integrated circuit testing, multiple fault diagnosis, multiple fault injection, multiple fault simulation, particle swarm optimisation, particle swarm optimization, particle swarm optimization (PSO) |
Abstract | This brief proposes a framework to analyze multiple faults based on multiple fault simulation in a particle swarm optimization environment. Experimentation shows that up to ten faults can be diagnosed in a reasonable time. However, the scheme does not put any restriction on the number of simultaneous faults. |
DOI | 10.1109/TVLSI.2013.2249542 |
Citation Key | 6488883 |