Biblio
This article presents the valuable experience and practical results of exploratory research by authors on the scientific problem of cyber-resilient (Cyber Resilience) critical information infrastructure in the previously unknown heterogeneous mass cyber attacks of attackers based on similarity invariants. It is essential that the results obtained significantly complement the well-known practices and recommendations of ISO 22301 (https://www.iso.org), MITER PR 15-1334 (www.mitre.org) and NIST SP 800-160 (www.nist.gov) in terms of developing quantitative metrics and cyber resistance measures. This allows you to open and formally present the ultimate law of the effectiveness of ensuring the cyber stability of modern systems of Industry 4.0. in the face of growing security threats.
Scan design is a universal design for test (DFT) technology to increase the observability and controllability of the circuits under test by using scan chains. However, it also leads to a potential security problem that attackers can use scan design as a backdoor to extract confidential information. Researchers have tried to address this problem by using secure scan structures that usually have some keys to confirm the identities of users. However, the traditional methods to store intermediate data or keys in memory are also under high risk of being attacked. In this paper, we propose a dynamic-key secure DFT structure that can defend scan-based and memory attacks without decreasing the system performance and the testability. The main idea is to build a scan design key generator that can generate the keys dynamically instead of storing and using keys in the circuit statically. Only specific patterns derived from the original test patterns are valid to construct the keys and hence the attackers cannot shift in any other patterns to extract correct internal response from the scan chains or retrieve the keys from memory. Analysis results show that the proposed method can achieve a very high security level and the security level will not decrease no matter how many guess rounds the attackers have tried due to the dynamic nature of our method.
Design for Testability (DfT) techniques allow devices to be tested at various levels of the manufacturing process. Scan architecture is a dominantly used DfT technique, which supports a high level of fault coverage, observability and controllability. However, scan architecture can be used by hardware attackers to gain critical information stored within the device. The security threats due to an unrestricted access provided by scan architecture has to be addressed to ensure hardware security. In this work, a solution based on the Clock and Data Recovery (CDR) method has been presented to authenticate users and limit the access to the scan architecture to authorized users. As compared to the available solution the proposed method presents a robust performance and reduces the area overhead by more than 10%.
Resilient control systems should efficiently restore control into physical systems not only after the sabotage of themselves, but also after breaking physical systems. To enhance resilience of control systems, given an originally minimal-input controlled linear-time invariant(LTI) physical system, we address the problem of efficient control recovery into it after removing a known system vertex by finding the minimum number of inputs. According to the minimum input theorem, given a digraph embedded into LTI model and involving a precomputed maximum matching, this problem is modeled into recovering controllability of it after removing a known network vertex. Then, we recover controllability of the residual network by efficiently finding a maximum matching rather than recomputation. As a result, except for precomputing a maximum matching and the following removed vertex, the worst-case execution time of control recovery into the residual LTI physical system is linear.
A technique of finding a set of sequential circuit nodes in which Trojan Circuits (TC) may be implanted is suggested. The technique is based on applying the precise (not heuristic) random estimations of internal node observability and controllability. Getting the estimations we at the same time derive and compactly represent all sequential circuit full states (depending on input and state variables) in which of that TC may be switched on. It means we obtain precise description of TC switch on area for the corresponding internal node v. The estimations are computed with applying a State Transition Graph (STG) description, if we suppose that TC may be inserted out of the working area (out of the specification) of the sequential circuit. Reduced Ordered Binary Decision Diagrams (ROBDDs) for the combinational part and its fragments are applied for getting the estimations by means of operations on ROBDDs. Techniques of masking TCs are proposed. Masking sub-circuits overhead is appreciated.
SoCs implementing security modules should be both testable and secure. Oversights in a design's test structure could expose internal modules creating security vulnerabilities during test. In this paper, for the first time, we propose a novel automated security vulnerability analysis framework to identify violations of confidentiality, integrity, and availability policies caused by test structures and designer oversights during SoC integration. Results demonstrate existing information leakage vulnerabilities in implementations of various encryption algorithms and secure microprocessors. These can be exploited to obtain secret keys, control finite state machines, or gain unauthorized access to memory read/write functions.