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Cyber-Physical Systems Virtual Organization
Read-only archive of site from September 29, 2023.
CPS-VO
Circuit faults
biblio
Slack removal for enhanced reliability and trust
Submitted by BrandonB on Wed, 05/06/2015 - 11:34am
Small Delay Defects
mission-critical application
pattern count
reliability enhancement
security of data
security vulnerabilities
security-critical application
slack removal
Slacks
malicious circuitries
test quality
testing
timing slacks
transition fault patterns
Trojan horses
trust enhancement
Wires
fabrication
care bit density intact
Circuit faults
delay defect detection
delay defects
delay unit insertion
delays
design for testability
design technique
At-speed Testing
Hardware
hardware trojan
Hardware Trojans
integrated circuit reliability
logic circuits
Logic gates
logic testing
biblio
Automated fault diagnosis in Multiple Inductive Loop Detectors
Submitted by BrandonB on Tue, 05/05/2015 - 9:17am
vehicles
Transfer Function
traffic flow detectors
series-connected multiple inductive loop detectors
Resonant frequency
Multiple Inductive Loop Detectors
inductive sensors
Frequency response
fault location
fault diagnosis
embedded systems
Embedded System
Detectors
Circuit faults
automated fault diagnosis
biblio
Error value driven fault analysis attack
Submitted by BrandonB on Fri, 05/01/2015 - 7:56am
advanced encryption standard
AES
Ciphers
Circuit faults
cryptographic circuits
Cryptography
encryption
Equations
Error value
error value driven fault analysis attack method
Fault analysis attacks
field programmable gate arrays
Side-channel attack
standards
Tamper resistance
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