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Cyber-Physical Systems Virtual Organization
Read-only archive of site from September 29, 2023.
CPS-VO
care bit density intact
biblio
Slack removal for enhanced reliability and trust
Submitted by BrandonB on Wed, 05/06/2015 - 11:34am
Small Delay Defects
mission-critical application
pattern count
reliability enhancement
security of data
security vulnerabilities
security-critical application
slack removal
Slacks
malicious circuitries
test quality
testing
timing slacks
transition fault patterns
Trojan horses
trust enhancement
Wires
fabrication
care bit density intact
Circuit faults
delay defect detection
delay defects
delay unit insertion
delays
design for testability
design technique
At-speed Testing
Hardware
hardware trojan
Hardware Trojans
integrated circuit reliability
logic circuits
Logic gates
logic testing
